ICP-MS

Detects and quantifies elements at extraordinarily low concentrations by vaporizing and ionizing a sample in an extremely hot plasma, then measuring the resulting ion masses.

References

• Houk, R.S., Fassel, V.A., Flesch, G.D., Svec, H.J., Gray, A.L., Taylor, C.E. "Inductively Coupled Argon Plasma as an Ion Source for Mass Spectrometric Determination of Trace Elements." Analytical Chemistry 52, no. 14 (1980): 2283–2289.