Kelvin Probe Force Microscopy

Maps local contact potential difference at nanometer resolution with a conductive AFM tip; under calibrated equilibrium conditions this can be converted to work-function variation.

References

• Nonnenmacher, M., O'Boyle, M., Wickramasinghe, H.K. "Kelvin Probe Force Microscopy." Applied Physics Letters 58, no. 25 (1991): 2921–2923.