Mapping Local Electrical Conductivity at Nanometer Resolution
A surface's electrical conductivity needs to be mapped at a spatial resolution fine enough to distinguish individual grains, defects, or nanoscale conductive pathways.
References
- Binnig, G., Quate, C.F., Gerber, C. "Atomic Force Microscope." Physical Review Letters 56, no. 9 (1986): 930–933.