Mapping Local Electrical Potential Variation Across a Surface

A surface's contact potential difference or work function needs to be mapped at fine spatial resolution, revealing electrical heterogeneity that a bulk electrical measurement can't localize.

References

• Nonnenmacher, M., O'Boyle, M., Wickramasinghe, H.K. "Kelvin Probe Force Microscopy." Applied Physics Letters 58, no. 25 (1991): 2921–2923.