Measuring Carrier Lifetime as a Proxy for Material Quality

A semiconductor's crystalline quality needs a fast, non-destructive assessment, and how long its excited charge carriers survive offers a sensitive stand-in for defect content.

References

• Kamat, P.V. "Photochemistry on Nonresonant and Resonant Quantum Dots." Journal of Physical Chemistry Letters 3, no. 4 (2012): 663–672.